On-Chip Phase Microscope/Beam Profiler Based on Differential Interference Contrast and/or Surface Plasmon Assisted Interference

CIT No. 
4633-D-C
Date Issued: 
April 02, 2013
Patent Number: 
8,411,282
Google Patents: 
Inventors: 
Xiquan Cui
Xin Heng
Changhuei Yang
Axel Scherer
Demetri Psaltis
Abstract: