On-Chip Phase Microscope/Beam Profiler Based on Differential Interference Contrast and/or Surface Plasmon Assisted Interference

CIT No. 
4633
Date Issued: 
August 03, 2010
Patent Number: 
7,768,654
Google Patents: 
Inventors: 
Xiquan Cui
Xin Heng
Changhuei Yang
Axel Scherer
Demetri Psaltis
Abstract: